Power Semiconductor Production Test Equipment

Dynex has had more than 30 years of experience in developing semiconductor production testers for our power semiconductor products, including Bipolar, GTO and IGBT variants.

  • IGBT Testing

IGBT Dynamic Test Equipment

The IGBT Dynamic Test Equipment can test IGBTs in the form of modules, or screening as substrates and provides engineering flexibility for changing test circuits and conditions for assessing the DUT (Device Under Test).

The equipment has a maximum capability of voltage up to 5kV and current up to 8,000A and a short circuit current of 18,000A. The DUT can be mounted upon a hot plate to be heated up to 175°C. The equipment has the option of having up to 6 different IGBT Gate Drives installed which is selected by the control software.

The system can be configured to apply multiple firing events to simulate “chopper” mode operation. A wide range of circuit inductances can be selected with 16 available presets ranging from 0µH to 1,250µH. More inductance can be added at the customer’s request.
The equipment is fully computer controlled and features a LabView based user interface with a touchscreen for direct control. It can be network ready for offline tasks such as reviewing test results or for the preparation of test programs.

IGBT Static Test Equipment

IGBT Static Test Equipment has the capability of testing IGBTs as modules or as substrates and provide engineering flexibility for changing test circuits and conditions for assessing the DUT (Device Under Test).
The equipment has a  maximum capability  of voltage  up to 7.5kV and current up to 6,000A. The equipment provides static testing for determining leakage current characterisation and breakdown, threshold and saturation voltages.
The equipment is fully computer controlled and features a LabView based user interface with a touchscreen for direct control. It can be network ready for offline tasks such as reviewing test results or for the preparation of test programs.